Determination of the Coefficient of Laser Radiation Reflection from Dielectric Targets in Vacuum

We present the results of experimental determination of the coefficients of laser radiation reflection (₁ 10.6 m and ₂ 1.06 m) from dielectric targets of complex chemical composition in vacuum with allowance for a regime of developed plasma formation.     

High‐throughput characterization of pattern formation in symmetric diblock copolymer films

Surface‐pattern formation in thin block copolymer films was investigated by utilizing a high‐throughput methodology to validate the combinatorial measurement approach and to demonstrate the value of the combinatorial method for scientific investigation. We constructed measurement libraries from images of subregions of block copolymer films having gradients in film thickness and a range of molecular mass, M. A single gradient film covers a wide range of film morphologies and contains information equivalent to a large number of measurements of films having a fixed thickness, h. Notably, the scale of the surface patterns is generally much larger than the molecular dimensions so that the interpretation of the patterns is more subtle than ordering in bulk block copolymer materials, and there is no predictive theory of this type of surface‐pattern formation. We observed a succession of surface patterns that repeat across the film with increasing h [extended smooth regions, regions containing circular islands, labyrinthine (“spinodal”) patterns, holes, and smooth regions again]. The extended smooth regions and the labyrinthine patterns appear to be novel features revealed by our combinatorial study, and these patterns occurred as bands of h that were quantized by integral multiples of the bulk lamellar period, L_o. The magnitude of the height gradient influenced the width of the bands, and the smooth regions occupied an increasing fraction of the film‐surface area with an increasing film gradient. The average size of the spinodal patterns, λ, was found to scale as λ ～ L or λ ～ M^?1.65 and reached a limiting size at long annealing times. The hole and island features had a size comparable to λ, and their size likewise decreased with increasing M. The smooth regions were attributed to an increase in the surface‐chain density in the outer brushlike block copolymer layer with increasing h, and the scaling of λ with M was interpreted in terms of the increasing surface elasticity with M. © 2001 John Wiley & Sons, Inc. J Polym Sci Part B: Polym Phys 39: 2141–2158, 2001     

Crown Inclusion Compounds with 3,4-Diamino-1,2,5-Oxadiazole. X-Ray Structures of Its 1:1 Inclusion Complexes with 15-Crown-5 and Benzo-15-crown-5

The X-ray crystal structures of two closely related molecular complexes of 15-crown-5 and benzo-15-crown-5 with 3,4-diamino-1,2,5-oxadiazole are reported (I and II). Both complexes are of 1:1 stoichiometry with the host–guest alternation in the infinitechains formed due to the unsymmetrical H-bonding patterns between the components. Crystals of I are monoclinic, P2_1/c, a = 7.856(3), b = 12.994(1), c = 16.033(1) , = 94.79(2)°, Z = 4, final R-factor is 0.0488. Crystals of II are orthorhombic, P2₁2₁2₁, a = 8.260(4), b = 15.692(5),c = 13.955(7) , Z = 4, final R-factor is 0.0522.     

Study of the electric capacitance spectra on symmetric quantum-dot pattern

We have calculated the ground-state energy of the symmetric quantum-dot pattern by the ab initio calculation method, i.e. unrestricted Hartree-Fock-Roothaan (UHFR) method based on the Gaussian basis, and studied their electric capacitance spectra, assuming each quantum dot of quantum-dot pattern to be confined in a three-dimensional spherical potential well of finite depth. For the systems in question, our results show that our method and theoretical model not only give the electric capacitance peaks similar to s-shell and p-shell atom-like quantum dot, but also show some new fine-structure of electric capacitance in the symmetric quantum-dot pattern system. This method might be a feasible tool to study few-electron problems on the symmetric quantum-dot pattern system.     

利用TEM对Si基片与MgO基片上生长的薄膜特性的研究

对生长在Si和MgO单晶基片上的不同厚度的单层NbN薄膜、双层薄膜AlN/NbN以及三层薄膜NbN/AlN/NbN应用透射电子显微镜(Transmission Electron Microscope,TEM)技术进行了分析研究,对这几种薄膜样品的微观结构、薄膜厚度以及各个边界的一些直观细节给出了较为清晰的图像。由透射电子显微镜的电子衍射图案计算了薄膜和单晶衬底的晶格常数,并与我们以前采用X射线衍射技术分析的结果进行了比较,结果有很好的吻合。     

有损压缩JPEG在载频条纹图分析中的应用研究

探讨了基于JPEG的有损压缩方法在载频条纹图分析中的应用前景。简介了当今流行的JPEG有损压缩技术和傅里叶变换轮廓术。使用专业软件对傅里叶变换轮廓术中拍摄的载频条纹图进行各种压缩比的压缩,解压后再解调出相位,与未经压缩的原图解调出的相位进行比较。将其相位误差与相位移法解调出的相位误差进行了对比,指出相对于相位移法而言,傅里叶变换轮廓术具有滤波的作用,对其拍摄的载频条纹图,应用JPEG压缩算法是可能的,解调出来的相位误差更小。     

模拟退火算法在波束图设计中的应用

摘要本文提出了基于模拟退火算法的波束设计方法。模拟退火算法模拟了固体缓慢退火从而获得最低内能的物理过程，是一种简单而有效的随机性全局优化算法。为证明该设计方法的可行性和有效性，给出了15元平面阵的设计实例以及仿真结果。结果表明，使用该方法设计的波束与常规方法相比，获得了更低的旁瓣级。     

中等尺寸SiN团簇结构和相对稳定性的研究(21≤N≤50,N=60)

在过去二十年里,对中等尺寸硅团簇的研究一直十分活跃.为阐明低能团簇从中等到大尺寸的生长行为,我们对SiN团簇在21≤N≤50,和N=60的结构和相对稳定性进行论述.对Si21-Si29,除Si27外最低能量结构是扁长形.对N≥30,SiN团簇倾向于形成填充富勒烯结构.随着团簇尺寸的增大(N≥41),内部开始出现四面体结构,可视为金刚石晶格结构形成的初始阶段.当团簇尺寸达到N=60时,其已偏离小团簇的类分子行为,但向块体结构的转变还没完成.中等尺寸硅团簇的填充富勒烯结构可以被看作是从类分子向块体过渡的中间阶段.     

天文导航中星体高精度细分定位方法研究

介绍了一种从星体图像中高精度提取恒星位置的方法.这种方法把星光成像看成是高斯点扩散函数模型,利用线性内插和最小二乘法拟合得到高斯曲面参数,从高斯曲面模型中得到亚像素级的恒星位置.由于直接进行高斯曲面拟合计算非常复杂,将二维曲面拟合转化为两个方向上的一维曲线拟合,分别得到不同的曲面系数.仿真结果表明当信噪比小于0.05时,定位精度能达到1/20像素,与质心法比较,高斯曲面拟合法精度高,抗噪声能力强.